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Secondary Ion Mass Spectrometry. SIMS 5: Proceedings of the 5.Internat.Conference

Secondary Ion Mass Spectrometry. SIMS 5: Proceedings of the 5.Internat.Conference
Catalogue Information
Field name Details
Editor Benninghoven, A.
Colton, R.J.
Simons, D.S.
Further Persons et al.
TITLE Secondary Ion Mass Spectrometry. SIMS 5
Subtitle Proceedings of the 5.Internat.Conference
Place of Publ. Berlin
Publisher Springer
Publ. Year 1986
Pages 561 S.
Figures 388 Fig.
Series Springer Series in Chemical Physics
Volume Vol. 44
ISBN 3-540-16263-1
Conf. Place Washington, D.C.(US)
Conf. Date 30.09.1985 - -
04.10.1985
Catalogue Information 20696 Beginning of record . Catalogue Information 20696 Top of page .
Item Information
Barcode Shelf Location Volume Ref. Branch Status
50026792 ZB: Ps 146
  Zentralbibliothek . Available .
50026793 E2M: Pq II(T) 009
  Plasmarand und Wand . Available .
. Catalogue Record 20696 ItemInfo Beginning of record . Catalogue Record 20696 ItemInfo Top of page .