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Secondary Ion Mass Spectrometry. SIMS 5: Proceedings of the 5.Internat.Conference
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Catalogue Record 20696
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Catalogue Information
Catalogue Record 20696
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Catalogue Information
Field name
Details
Editor
Benninghoven, A.
Colton, R.J.
Simons, D.S.
Further Persons
et al.
TITLE
Secondary Ion Mass Spectrometry. SIMS 5
Subtitle
Proceedings of the 5.Internat.Conference
Place of Publ.
Berlin
Publisher
Springer
Publ. Year
1986
Pages
561 S.
Figures
388 Fig.
Series
Springer Series in Chemical Physics
Volume
Vol. 44
ISBN
3-540-16263-1
Conf. Place
Washington, D.C.(US)
Conf. Date
30.09.1985 - -
04.10.1985
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Catalogue Record 20696
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Catalogue Record 20696
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Catalogue Information 20696
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Branch
Status
50026792
ZB: Ps 146
Zentralbibliothek
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Available
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50026793
E2M: Pq II(T) 009
Plasmarand und Wand
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Catalogue Record 20696
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