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Secondary Ion Mass Spectrometry. SIMS 2: Proceedings of the 2.Internat. Conference

Secondary Ion Mass Spectrometry. SIMS 2: Proceedings of the 2.Internat. Conference
Catalogue Information
Field name Details
Editor Benninghoven, A.
Evans, C.A. Jr.
Powell, R.A.
Further Persons et al.
TITLE Secondary Ion Mass Spectrometry. SIMS 2
Subtitle Proceedings of the 2.Internat. Conference
Place of Publ. Berlin
Publisher Springer
Publ. Year 1979
Pages 295 S.
Figures 234 Fig.
Series Springer Series in Chemical Physics
Volume Vol. 9
ISBN 3-540-09843-7
Conf. Place Stanford, CA(US)
Conf. Date 27.08.1979 - -
31.08.1979
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Item Information
Barcode Shelf Location Volume Ref. Branch Status
50089680 ZB: Ps 146
   Zentralbibliothek . Available .
50089681 E2M: Pq II(T) 009
   Plasmarand und Wand . Available .
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