1 |
![](data:image/gif;base64,R0lGODlhAQABAIAAAAAAAP///yH5BAEAAAAALAAAAAABAAEAAAIBRAA7) |
Electronic Materials and Processing, Thin Films, and Fusion Technology [Conference]
|
|
1990 |
|
Regalstandort: ZB: Zeitschrift.
Anzahl Exemplare: 2.
|
2 |
![](data:image/gif;base64,R0lGODlhAQABAIAAAAAAAP///yH5BAEAAAAALAAAAAABAAEAAAIBRAA7) |
Ion Formation from Organic Solids: Proc.of the 2.International Conference [Conference]
|
|
1983 |
|
Regalstandort: ZB: Pq 257.
Anzahl Exemplare: 1.
|
3 |
![Quantitative Bestimmung der Sekundaerionenausbeuten sauerstoffbedeckter Metalle Quantitative Bestimmung der Sekundaerionenausbeuten sauerstoffbedeckter Metalle](Cover.cls?type=cover&isbn=9783531027845&size=100) |
Quantitative Bestimmung der Sekundaerionenausbeuten sauerstoffbedeckter Metalle [Book]
|
Benninghoven, A.
|
1978 |
|
Regalstandort: ZB: Pq 224.
Anzahl Exemplare: 2.
|
4 |
![Secondary Ion Mass Spectrometry. SIMS 2: Proceedings of the 2.Internat. Conference Secondary Ion Mass Spectrometry. SIMS 2: Proceedings of the 2.Internat. Conference](Cover.cls?type=cover&isbn=9783540098430&size=100) |
Secondary Ion Mass Spectrometry. SIMS 2: Proceedings of the 2.Internat. Conference [Conference]
|
|
1979 |
|
Regalstandort: ZB: Ps 146.
Anzahl Exemplare: 2.
|
5 |
![Secondary Ion Mass Spectrometry. SIMS 3: Proceedings of the 3.Internat. Conference Secondary Ion Mass Spectrometry. SIMS 3: Proceedings of the 3.Internat. Conference](Cover.cls?type=cover&isbn=9783540113720&size=100) |
Secondary Ion Mass Spectrometry. SIMS 3: Proceedings of the 3.Internat. Conference [Conference]
|
|
1982 |
|
Regalstandort: ZB: Ps 146.
Anzahl Exemplare: 2.
|
6 |
![Secondary Ion Mass Spectrometry. SIMS 5: Proceedings of the 5.Internat.Conference Secondary Ion Mass Spectrometry. SIMS 5: Proceedings of the 5.Internat.Conference](Cover.cls?type=cover&isbn=9783540162636&size=100) |
Secondary Ion Mass Spectrometry. SIMS 5: Proceedings of the 5.Internat.Conference [Conference]
|
|
1986 |
|
Regalstandort: ZB: Ps 146.
Anzahl Exemplare: 2.
|
7 |
![Secondary Ion Mass Spectrometry: Proceedings of the 4.Internat. Conf. on ... Secondary Ion Mass Spectrometry: Proceedings of the 4.Internat. Conf. on ...](Cover.cls?type=cover&isbn=9783540133162&size=100) |
Secondary Ion Mass Spectrometry: Proceedings of the 4.Internat. Conf. on ... [Conference]
|
|
1984 |
|
Regalstandort: ZB: Ps 146.
Anzahl Exemplare: 1.
|
8 |
![Secondary Ion Mass Spectrometry: Basic Concepts, Instrumental Aspects, Applications and Trends Secondary Ion Mass Spectrometry: Basic Concepts, Instrumental Aspects, Applications and Trends](Cover.cls?type=cover&isbn=9780471010562&size=100) |
Secondary Ion Mass Spectrometry: Basic Concepts, Instrumental Aspects, Applications and Trends [Book]
|
Benninghoven, A.
|
1987 |
|
Regalstandort: E2M: Pq II 007.
Anzahl Exemplare: 1.
|
9 |
![](data:image/gif;base64,R0lGODlhAQABAIAAAAAAAP///yH5BAEAAAAALAAAAAABAAEAAAIBRAA7) |
Secondary Ion Mass Spectrometry: Proc.of the 6.Internat.Conference [Conference]
|
|
1988 |
|
Regalstandort: E2M: Pq II(T) 009.
Anzahl Exemplare: 1.
|
10 |
![](data:image/gif;base64,R0lGODlhAQABAIAAAAAAAP///yH5BAEAAAAALAAAAAABAAEAAAIBRAA7) |
Selected Proceedings of the 11. International Vacuum Congress (IVC-11). 7. International Conference on Solid Surfaces (ICSS-7) [Conference]
|
|
1990 |
|
Regalstandort: ZB: Zeitschrift.
Anzahl Exemplare: 2.
|
11 |
![](data:image/gif;base64,R0lGODlhAQABAIAAAAAAAP///yH5BAEAAAAALAAAAAABAAEAAAIBRAA7) |
Surface Science Section [Conference]
|
|
1990 |
|
Regalstandort: ZB: Zeitschrift.
Anzahl Exemplare: 2.
|