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Your Search for BENNINGHOVEN A returned 11 Items

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1 Electronic Materials and Processing, Thin Films, and Fusion Technology [Conference]
Series:Selected Proceedings of the 11.International Vacuum Congress (IVC-11). 7.International Conference on Solid Surfaces (ICSS-7) / VacuumVolume:Part 2 / Vol. 41, Nos. 4-6
 		  1990 Conference Shelf Location: ZB: Zeitschrift.
Number of Holdings: 2.
2 Ion Formation from Organic Solids: Proc.of the 2.International Conference [Conference]
Series:Springer Series in Chemical PhysicsVolume:Vol. 25
 		  1983 Conference Shelf Location: ZB: Pq 257.
Number of Holdings: 1.
3 Quantitative Bestimmung der Sekundaerionenausbeuten sauerstoffbedeckter Metalle Quantitative Bestimmung der Sekundaerionenausbeuten sauerstoffbedeckter Metalle [Book]
Series:Forschungsberichte des Landes Nordrhein-WestfalenVolume:Nr. 2784
 		Benninghoven, A. 1978 Book Shelf Location: ZB: Pq 224.
Number of Holdings: 2.
4 Secondary Ion Mass Spectrometry. SIMS 2: Proceedings of the 2.Internat. Conference Secondary Ion Mass Spectrometry. SIMS 2: Proceedings of the 2.Internat. Conference [Conference]
Series:Springer Series in Chemical PhysicsVolume:Vol. 9
 		  1979 Conference Shelf Location: ZB: Ps 146.
Number of Holdings: 2.
5 Secondary Ion Mass Spectrometry. SIMS 3: Proceedings of the 3.Internat. Conference Secondary Ion Mass Spectrometry. SIMS 3: Proceedings of the 3.Internat. Conference [Conference]
Series:Springer Series in Chemical PhysicsVolume:Vol. 19
 		  1982 Conference Shelf Location: ZB: Ps 146.
Number of Holdings: 2.
6 Secondary Ion Mass Spectrometry. SIMS 5: Proceedings of the 5.Internat.Conference Secondary Ion Mass Spectrometry. SIMS 5: Proceedings of the 5.Internat.Conference [Conference]
Series:Springer Series in Chemical PhysicsVolume:Vol. 44
 		  1986 Conference Shelf Location: ZB: Ps 146.
Number of Holdings: 2.
7 Secondary Ion Mass Spectrometry: Proceedings of the 4.Internat. Conf. on ... Secondary Ion Mass Spectrometry: Proceedings of the 4.Internat. Conf. on ... [Conference]
Series:Secondary Ion Mass Spectrometry / Springer Series in Chemical PhysicsVolume:1983 / Vol. 36
 		  1984 Conference Shelf Location: ZB: Ps 146.
Number of Holdings: 1.
8 Secondary Ion Mass Spectrometry: Basic Concepts, Instrumental Aspects, Applications and Trends Secondary Ion Mass Spectrometry: Basic Concepts, Instrumental Aspects, Applications and Trends [Book]
Series:Chemical AnalysisVolume:Vol. 86
 		Benninghoven, A. 1987 Book Shelf Location: E2M: Pq II 007.
Number of Holdings: 1.
9 Secondary Ion Mass Spectrometry: Proc.of the 6.Internat.Conference [Conference]
Series:Secondary Ion Mass SpectrometryVolume:1987
 		  1988 Conference Shelf Location: E2M: Pq II(T) 009.
Number of Holdings: 1.
10 Selected Proceedings of the 11. International Vacuum Congress (IVC-11). 7. International Conference on Solid Surfaces (ICSS-7) [Conference]
Series:Selected Proceedings of the 11. International Vacuum Congress (IVC-11). 7. International Conference on Solid Surfaces (ICSS-7) / VacuumVolume:Part 3 / Vol. 41, Nos. 7-9
 		  1990 Conference Shelf Location: ZB: Zeitschrift.
Number of Holdings: 2.
11 Surface Science Section [Conference]
Series:Selected Proceedings of the 11.International Vacuum Congress (IVC-11). 7.International Conference on Solid Surfaces (ICSS-7) / VacuumVolume:Part 1 / Vol. 41, Nos. 1-3
 		  1990 Conference Shelf Location: ZB: Zeitschrift.
Number of Holdings: 2.
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The titles shown in BOLD have items available, non bold titles do not have any items in stock