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Devices, Measurements, and Properties
Kategorie Beschreibung
029mb
100cBass, Michael
104cVan Stryland, Eric W.
108cWilliams, David R.
200 Optical Society of America, Washington, D.C.(US)
331 Devices, Measurements, and Properties
403 2nd Ed.
410 New York,NY
412 McGraw-Hill
425 1995
433 Getr.Pag.
454cHandbook of Optics
455 Vol. 2
540 0-07-047974-7